I am an assistant professor and Researcher at the Department of Information Security, Faculty of Information Technology, Czech Technical University in Prague, and Researcher at the Department of Materials and Technology, Faculty of Electrical Engineering, University of West Bohemia in Pilsen.

My research is focused on the reliability and security of CMOS circuits, circuit modeling, and simulation, and embedded system software architecture.

Current Professional Activities

• IEEE Czechoslovakia Section YP Affinity Group - Chair 2019 - 2022; Vice-Chair since 2022
• The Prague Embedded Systems Workshop (PESW) - Student Poster Session Chair/Co-Chair since 2016; PC Member since 2022
• The International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) - PC Member since 2023

• International Symposium on Design and Diagnostics of Electronic Circuits and Systems 2023 - Publication Co-Chair

• All Current and Past Activities

Recent Publications

1. Petryk, D., Dyka, Z., Krstic, M., Bělohoubek, J., Fišer, P., Steiner, F., Blecha, T., Langendörfer, P., & Kabin, I. (2023). On the Influence of the Laser Illumination on the Logic Cells Current Consumption : First measurement results. 2023 30th IEEE International Conference on Electronics, Circuits and Systems (ICECS), 1–6. https://doi.org/10.1109/ICECS58634.2023.10382757 bibtex | DOI | manuscript
2. Syrovy, Tomas and Bodnar, Michal and Ozanak, Pavol and Pretl, Silvan and Blecha, Tomas and Cengery, Jiri and Belohoubek, Jan and Hamacek, Ales and Janda, Martin. (2023). Elektronický senzor pro selektivní detekci kapalin (Electronic sensor for selective detection of liquids). Univerzita Pardubice, Západočeská univerzita v Plzni, and TESLA BLATNÁ, a.s. https://isdv.upv.cz/webapp/resdb.print_detail.det?pspis=PT/2022-80&plang=CS bibtex | patent file
   Patent Nr. CZ 309455 B6

1. Bělohoubek, J., Fišer, P., & Schmidt, J. (2021). Optically induced static power in combinational logic: Vulnerabilities and countermeasures. Microelectronics Reliability, 124, 114281. https://doi.org/10.1016/j.microrel.2021.114281 bibtex | DOI | manuscript
   Cited by:
   1. Kumar, A., Tripathi, S. L., & Subramaniam, U. (2021). Variability Analysis of SBOX With CMOS 45 nm Technology. Wireless Personal Communications.
   2. Tebina, N.-E. O., Zergainoh, N.-E., Hubert, G., & Maistri, P. (2023). Simulation Methodology for Assessing X-Ray Effects on Digital Circuits. 2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 1–6. https://doi.org/10.1109/DFT59622.2023.10313564 | DOI
2. Belohoubek, J. (2021). Testability and Physical Security: The Cell-Level Approach [PhD thesis]. Czech Technical University in Prague. bibtex | manuscript | slides
3. Belohoubek, Jan and Fiser, Petr and Schmidt, Jan. (2021). Zapojení standardní buňky CMOS se sníženou datovou závislostí statické spotřeby (Connection of a standard CMOS cell with reduced data dependence of static consumption). České vysoké učení technické v Praze. https://isdv.upv.cz/webapp/resdb.print_detail.det?pspis=PT/2020-153&plang=CS bibtex | patent file
   Patent Nr. CZ 308895 B6
4. Standard Cell Design For Data-Independent Static Power Under Illumination. (2021, July). 9th Prague Embedded Systems Workshop (PESW), 2021.
5. Standard Cell Design For Data-Independent Static Power Under Illumination. (2021, July). bibtex | slides